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1

Influence of Chromium and Titanium Oxide Dopants on the Real Structure and the Mechanical Properties of Corundum Single Crystals

Dr.-Ing. T. Gościńska, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1979

Language:

english

File:

PDF, 839 KB

english, 1979

2

Impurity macroincorporation in silicon carbide epitaxial layers

J. Auleytner, I. Šwiderski, W. Zahorowski

Journal:

Journal of Crystal Growth

Year:

1977

Language:

english

File:

PDF, 874 KB

english, 1977

3

Directional crystallization of CdHgTe in microgravity conditions

R.R. Gałazka, T. Warmiński, J. Bak, J. Auleytner, T. Dietl, A.S. Okhotin, R.P. Borovikova, I.A. Zubritskij

Journal:

Journal of Crystal Growth

Year:

1981

Language:

english

File:

PDF, 1.09 MB

english, 1981

4

Extended x-ray bremsstrahlung isochromat of Pd

Sobczak, E., Auleytner, J.

Journal:

Physical Review B

Year:

1988

Language:

english

File:

PDF, 604 KB

english, 1988

5

Study of Extended Defect Structure Induced by Pulsed Laser Annealing in Implanted Silicon Crystals

D. Klinger, M. Lefeld-Sosnowska, D. Żymierska, J. Auleytner, B. Kozankiewicz, K. Regiński

Journal:

physica status solidi (a)

Year:

1999

Language:

english

File:

PDF, 215 KB

english, 1999

6

Comparative Study of the Surface Roughness by AFM and GIXR

D. Żymierska, J. Auleytner, T. Kobiela, R. Duś

Journal:

physica status solidi (a)

Year:

2000

Language:

english

File:

PDF, 147 KB

english, 2000

7

Investigation of the Fine Structure of the Nb Isochromats within the Electron Energy Range from 0 to 60 eV

Prof. Dr. J. Auleytner, K. Ławniczak, E. Sobczak

Journal:

Annalen der Physik

Year:

1975

Language:

english

File:

PDF, 228 KB

english, 1975

8

X-Ray Studies of Dislocations in Crystals Deformed by Bending

Prof. Dr. J. Auleytner, J. Wasik

Journal:

Crystal Research and Technology

Year:

1967

Language:

english

File:

PDF, 216 KB

english, 1967

9

Ein- und Mehrkristallspektrometrie und Fragen der Abbildung

Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1972

Language:

german

File:

PDF, 558 KB

german, 1972

10

Investigations of the defect structure of CdS single crystals and explanation of the exciton lines shift

Prof. Dr. J. Auleytner, J. Bak, B. S. Razbirin, I. W. Makarenko

Journal:

Crystal Research and Technology

Year:

1975

Language:

english

File:

PDF, 667 KB

english, 1975

11

The influence of the dislocation density on the sulphur segregation at the Ni(110) surface in the course of heating

Prof. Dr. sc. F. Storbeck, T. Heyn, Prof. Dr. habil. J. Auleytner, G. Jasiolek

Journal:

Crystal Research and Technology

Year:

1980

Language:

english

File:

PDF, 533 KB

english, 1980

12

The X-ray method for the determination of damaged layer thickness of the Si crystal surface

Prof. Dr. J. Auleytner, J. Bak, Z. Furmanik, M. Maciaszek, A. Saulewicz

Journal:

Crystal Research and Technology

Year:

1980

Language:

english

File:

PDF, 242 KB

english, 1980

13

Defect Investigations in CdTe Crystals by RXT, SCL, and EBIC(V) Techniques

MSc. M. Klimkiewics, Prof. J. Auleytner, Dos. dr habil. T. Warmiński

Journal:

Crystal Research and Technology

Year:

1981

Language:

english

File:

PDF, 634 KB

english, 1981

14

Influence of non-uniformity of laser beam intensity on the surface layer structure of implanted silicon crystals

M. Wielunski, J. Auleytner, S. Czarnecki, A. Turos, D. Wielunska

Journal:

Crystal Research and Technology

Year:

1982

Language:

english

File:

PDF, 431 KB

english, 1982

15

X-Ray topographic study of the influence of thermal annealing on the bending of 49BF2+-implanted Si wafers

Dr. I. S. Vassilev, Dr. Z. Furmanik, I. N. Petrov, P. A. Botev, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1982

Language:

english

File:

PDF, 577 KB

english, 1982

16

X-ray and electron microscopy studies of arsenium implanted silicon crystals after a pulsed laser annealing

Dr. B. Bryza, Prof. Dr. J. Auleytner, Dr. H. Bartsch, Dr. K. Wieteska

Journal:

Crystal Research and Technology

Year:

1983

Language:

english

File:

PDF, 411 KB

english, 1983

17

A combination of oscillating slit and oscillating film techniques for the investigation of lattice defects

Prof. J. Auleytner, Dr. Z. Furmanik

Journal:

Crystal Research and Technology

Year:

1983

Language:

english

File:

PDF, 443 KB

english, 1983

18

X-ray and scanning cathodoluminescence imaging of small-angle grain boundaries and dislocations in CdTe crystals

Dr. M. Klimkiewicz, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1983

Language:

english

File:

PDF, 321 KB

english, 1983

19

X-Ray study of the defect structure of PbTe single crystals

Dr. H. Berger, Dr. E. Mizera, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1984

Language:

english

File:

PDF, 404 KB

english, 1984

20

TEM and X-ray investigations of defect structure of PbSnTe crystal

J. Morawiec, Dr. J. Auleytner, Dr. Z. Furmanik, Dr. A. Jȩdrzejczak

Journal:

Crystal Research and Technology

Year:

1985

Language:

english

File:

PDF, 374 KB

english, 1985

21

Deformation state of 49BF-implanted Si wafers after high-temperature thermal annealing

Dr. I. S. Vassilev, Dr. I. N. Petrov, P. A. Botev, Dr. Z. Furmanik, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1985

Language:

english

File:

PDF, 287 KB

english, 1985

22

Application of X-ray methods for the investigation of structural effects caused by high-energy argon ions bombardment in silicon crystal

Prof. Dr. J. Auleytner, Z. Furmanik, J. Gorecka

Journal:

Crystal Research and Technology

Year:

1987

Language:

english

File:

PDF, 242 KB

english, 1987

23

On the possibility of application of x-ray diffraction edge contrast for the quantitative determination of high-energy heavy ion range in silicon

Prof. Dr. J. Auleytner, J. Bak-Misiuk, Z. Furmanik, J. Morawiec

Journal:

Crystal Research and Technology

Year:

1988

Language:

english

File:

PDF, 350 KB

english, 1988

24

X-ray characterization of CdTe crystals with natural faces

Prof. Dr. J. Auleytner, J. Majewski, Z. Furmanik, Z. Golacki

Journal:

Crystal Research and Technology

Year:

1990

Language:

english

File:

PDF, 325 KB

english, 1990

25

X-ray and RHEED Characterization of Ge Ions-Implanted Si Crystals Subjected to Pulsed-Laser Annealing

Prof. J. Auleytner, Dr. H. Fiedorowicz, Z. Furmanik, Dr. Z. Patron, Dr. K. Regiński

Journal:

Crystal Research and Technology

Year:

1992

Language:

english

File:

PDF, 376 KB

english, 1992

26

The Real Structure of Ge Ions-implanted Si Crystals Subjected to Thermal Annealing

Prof. J. Auleytner, Mgr. J. Adamczewska, Dr. K. Reginński

Journal:

Crystal Research and Technology

Year:

1993

Language:

english

File:

PDF, 294 KB

english, 1993

27

DCXS and RHEED characterization of effectiveness of annealing implanted Si crystals by using pulsed UV excimer laser and sample scanning technique

Prof. J. Auleytner, Dr. B. Kozankiewicz, Dr. K. Regiński

Journal:

Crystal Research and Technology

Year:

1994

Language:

english

File:

PDF, 267 KB

english, 1994

28

X-ray electrono-optical and SIMS characterization of Si crystals implanted with Bi ions before and after rapid thermal annealing

J. Auleytner, Mgr. J. Adamczewska, Dr. A. Barcz, Dr. J. Górecka, Dr. K. Regiński

Journal:

Crystal Research and Technology

Year:

1995

Language:

english

File:

PDF, 312 KB

english, 1995

29

X-ray diffraction investigation of structure perfection state of silicon crystals after irradiation by fast uranium ions

Prof.J. Auleytner, V. Khrupa, A. Briginets, M. Skorokhold, Prof.L. Datsenko

Journal:

Crystal Research and Technology

Year:

1995

Language:

english

File:

PDF, 438 KB

english, 1995

30

The Microcamera Used for Photoelectron Excited by the X-ray Standing Wave (XSW) Recording and Submicron Layer Structure Studies

Prof. J. Auleytner, K. Godwod, J. Pelka

Journal:

Crystal Research and Technology

Year:

1995

Language:

english

File:

PDF, 381 KB

english, 1995

31

Theoretical Study of Ge Implanted Silicon Subjected to Pulsed Excimer (XeCl) Laser Radiation

D. Klinger, Prof. J. Auleytner, D. Z̊ymierska

Journal:

Crystal Research and Technology

Year:

1996

Language:

english

File:

PDF, 229 KB

english, 1996

32

Application of X-rays to the Study of the Surface Roughness

Dr. D. Żymierska, Prof. Dr. J. Auleytner

Journal:

Crystal Research and Technology

Year:

1997

Language:

english

File:

PDF, 378 KB

english, 1997

33

Theoretical Study of Recrystallization Process of Amorphous Ge Layer Subjected to Pulsed Excimer (XeCl) Laser Radiation

Mrs. D. Klinger, Prof Dr. J. Auleytner, D. Z̊ymierska

Journal:

Crystal Research and Technology

Year:

1997

Language:

english

File:

PDF, 240 KB

english, 1997

34

Phase and amplitude analysis of EXBIFS as compared to EXAFS

E. Sobczak, J. Auleytner, S. Mobilio, A. Balerna, O. Smotlacha

Journal:

Physica B: Condensed Matter

Year:

1989

Language:

english

File:

PDF, 254 KB

english, 1989

35

X-ray study of Si crystals irradiated by fast uranium ions

J. Auleytner, J. Bak-Misiuk, Z. Furmanik, M. Toulemonde, J. Vetter

Journal:

International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements

Year:

1991

Language:

english

File:

PDF, 226 KB

english, 1991

36

X-ray examination of the real structure of γ-irradiated NaClO3 single crystals

J. A. Stepień, J. Auleytner, K. Łukaszewicz

Journal:

physica status solidi (a)

Year:

1972

Language:

english

File:

PDF, 488 KB

english, 1972

37

Changes of X-ray topographic contrast due to annealing of boron-implanted silicon

W. H. Hubrig, J. Auleytner, M. Maciaszek

Journal:

physica status solidi (a)

Year:

1976

Language:

english

File:

PDF, 1.24 MB

english, 1976

38

Soft X-Ray Emission Spectra of Aluminium and Manganese from Gd(Al1−xMnx)2 Intermetallic Compounds

A. Slebarski, K. Ławniczak, J. Auleytner

Journal:

physica status solidi (a)

Year:

1979

Language:

english

File:

PDF, 325 KB

english, 1979

39

On X-ray and electron microscopic characterization of lattice defects in AIIBVI semiconductor compounds

J. Auleytner, Z. Liliental, E. Mizera, T. Warmiński

Journal:

physica status solidi (a)

Year:

1979

Language:

english

File:

PDF, 570 KB

english, 1979

40

Structural Changes in Solids Induced by Heavy Ions at Energies of Mev/n. Results of X-Ray and Electron Microscopic Studies

Journal:

physica status solidi (a)

Year:

1989

Language:

english

File:

PDF, 721 KB

english, 1989

41

High Energy Heavy Ion Irradiation of Silicon

M. Toulemonde, J. Dural, G. Nouet, P. Mary, J. F. Hamet, M. F. Beaufort, J. C. Desoyer, C. Blanchard, J. Auleytner

Journal:

physica status solidi (a)

Year:

1989

Language:

english

File:

PDF, 412 KB

english, 1989

42

X-Ray Investigation of Post-Implantion Deformation of a Si Crystal Caused by High-Energy Ar Ions

J. N. Górecka, J. Auleytner

Journal:

physica status solidi (a)

Year:

1993

Language:

english

File:

PDF, 494 KB

english, 1993

43

Formation of dislocations and other types of extended defects by ion implantation

J. Auleytner, J. Morawiec

Journal:

physica status solidi (a)

Year:

1993

Language:

english

File:

PDF, 396 KB

english, 1993

44

X-Ray Investigations of Dislocations in an Implanted Si Crystal Induced by Pulsed Laser Annealing

J. Auleytner, M. Skorokhod, L. Datsenko, V. Khrupa, A. Briginets

Journal:

physica status solidi (a)

Year:

1995

Language:

english

File:

PDF, 214 KB

english, 1995

45

Comparative studies of ion-implanted crystals subjected to pulsed-laser and thermal annealings by means of X-ray and electron-optical methods

Journal:

physica status solidi (a)

Year:

1995

Language:

english

File:

PDF, 575 KB

english, 1995

46

Schwenkfilm-Methode und ihre Anwendung bei Untersuchungen dynamischer Effekte der Röntgenstrahlstreuung im Kristallgitter

J. Auleytner, E. Zielińska-Rohozińska

Journal:

physica status solidi (b)

Year:

1963

Language:

german

File:

PDF, 324 KB

german, 1963

47

X-Ray Investigation of Gallium Doped CdTe

J. Auleytner, J. Pielaszek

Journal:

physica status solidi (b)

Year:

1965

Language:

english

File:

PDF, 75 KB

english, 1965

48

Röntgenographische Methode zur Untersuchung der Substruktur im Oberflächenbereich von Einkristallen

J. Auleytner, B. Gajič

Journal:

physica status solidi (b)

Year:

1966

Language:

german

File:

PDF, 303 KB

german, 1966

49

Application of X-Ray Methods to the Study of the Real Structure of Monocrystalline Epitaxial Layers

J. Auleytner, E. Godwod, J. Litwih, Z. Wołoszyn

Journal:

physica status solidi (b)

Year:

1967

Language:

english

File:

PDF, 152 KB

english, 1967

50

Investigation of the Real Structures of Cds Crystals in Connection with the Shift of Exciton Lines

J. Auleytner, E. F. Gross, A. A. Kralina, B. S. Razbirin

Journal:

physica status solidi (b)

Year:

1967

Language:

english

File:

PDF, 208 KB

english, 1967

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